Thin Layer Chronoamperometry
Application ID: 14423
The common electroanalytical method of exhaustive amperometric detection in a microscopic thin layer is modelled as a 1D-symmetric diffusion problem. The simulated result agrees with the analytical Cottrell equation at short times, and deviates as expected at long times when the diffusion layer spans the thin layer cell.
This application was built using the following:Electrochemistry Module
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